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Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy
Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy
Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy
Enzel, P. (Autor:in) / Henderson, G. S. (Autor:in) / Ozin, G. A. (Autor:in) / Bedard, R. L. (Autor:in)
ADVANCED MATERIALS -DEERFIELD BEACH- ; 7 ; 64
01.01.1995
64 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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