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Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy

Enzel, P. / Henderson, G. S. / Ozin, G. A. / Bedard, R. L.

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Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy

Enzel, P. / Henderson, G. S. / Ozin, G. A. / Bedard, R. L.

Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy

Enzel, P. / Henderson, G. S. / Ozin, G. A. / Bedard, R. L.

Access

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Imaging the Surface of Nanoporous Semiconductors by Atomic Force Microscopy

Contributors:

Enzel, P. (author) / Henderson, G. S. (author) / Ozin, G. A. (author) / Bedard, R. L. (author)

Published in:

ADVANCED MATERIALS -DEERFIELD BEACH- ; 7 ; 64

Publication date:

1995-01-01

Size:

64 pages

ISSN:

0935-9648

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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