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Three-dimensional analysis of modulated photoreflectance in a silicon wafer
Three-dimensional analysis of modulated photoreflectance in a silicon wafer
Three-dimensional analysis of modulated photoreflectance in a silicon wafer
Kim, H. C. (Autor:in) / Sun Chul Kim (Autor:in) / Moon Gyu Jang (Autor:in) / Jeong Ki Lee (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 30 ; 3761
01.01.1995
3761 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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