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Localised strain characterization in semiconductor structures using electron diffraction contrast imaging
Localised strain characterization in semiconductor structures using electron diffraction contrast imaging
Localised strain characterization in semiconductor structures using electron diffraction contrast imaging
Janssens, K. G. F. (Autor:in) / Van der Biest, O. (Autor:in) / Vanhellemont, J. (Autor:in) / Maes, H. E. (Autor:in)
01.01.1995
66 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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