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Minority and majority carrier traps associated with oxidation induced stacking faults in silicon
Minority and majority carrier traps associated with oxidation induced stacking faults in silicon
Minority and majority carrier traps associated with oxidation induced stacking faults in silicon
Evans, J. H. (Autor:in) / Davidson, J. A. (Autor:in) / Saritas, M. (Autor:in) / Vandini, M. (Autor:in)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 11 ; 696
01.01.1995
696 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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