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    Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

    New search for: Evans, J. H.
    New search for: Davidson, J. A.
    New search for: Saritas, M.
    New search for: Vandini, M.

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    Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

    New search for: Evans, J. H.
    New search for: Davidson, J. A.
    New search for: Saritas, M.
    New search for: Vandini, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

    New search for: Evans, J. H.
    New search for: Davidson, J. A.
    New search for: Saritas, M.
    New search for: Vandini, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

    Contributors:

    Evans, J. H. (author) / Davidson, J. A. (author) / Saritas, M. (author) / Vandini, M. (author)

    Published in:

    MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 11 ; 696

    Publication date:

    1995-01-01

    Size:

    696 pages

    ISSN:

    0267-0836

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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