Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

Evans, J. H. / Davidson, J. A. / Saritas, M. et al. | British Library Online Contents | 1995

Gettering phenomenon of oxidation-induced stacking-faults in silicon-on-insulator structure by wafer-direct-bonding method

Kim, K.-T. / Choi, D.-J. | British Library Online Contents | 2001

Electronic Localization around Stacking Faults in Silicon Carbide

Iwata, H. / Lindefelt, U. / Oberg, S. et al. | British Library Online Contents | 2002

Ordered stacking faults within nanosized silicon precipitates in aluminum alloy

Xie, Dong Yue / Yan, Jiawei / Li, Yangxin et al. | British Library Online Contents | 2017

Lifetime Identification of Thermal Oxidation Process Induced Contamination in Silicon Wafers

Daio, H. / Yakushiji, K. / Buczkowski, A. et al. | British Library Online Contents | 1995