Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
The fractal approach for the evaluation of microdefects in silicon
The fractal approach for the evaluation of microdefects in silicon
The fractal approach for the evaluation of microdefects in silicon
Fedtchouk, A. P. (Autor:in) / Rudenko, R. A. (Autor:in) / Shevchenko, L. D. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 34 ; 164-167
01.01.1995
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
| British Library Online Contents | 2005
Microdefects induced by cavitation for gettering in silicon wafer
| British Library Online Contents | 2006
Microdefects in Nitrogen Doped FZ Silicon Revealed By Li^+ Drifting
| British Library Online Contents | 1995
Material damage evaluation with measured microdefects and multiresolution numerical analysis
| British Library Online Contents | 2014
The effect of carbon and antimony on grown-in microdefects in Czochralski silicon crystals
| British Library Online Contents | 2006