Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Microdefects in Nitrogen Doped FZ Silicon Revealed By Li^+ Drifting
Microdefects in Nitrogen Doped FZ Silicon Revealed By Li^+ Drifting
Microdefects in Nitrogen Doped FZ Silicon Revealed By Li^+ Drifting
Knowlton, W. B. (Autor:in) / Walton, J. T. (Autor:in) / Lee, J. S. (Autor:in) / Wong, Y. K. (Autor:in) / Haller, E. E. (Autor:in) / Ammon, W. V. (Autor:in) / Zulehner, W. (Autor:in)
MATERIALS SCIENCE FORUM ; 1761-1766
01.01.1995
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Laser Scattering Measurement of Microdefects on Silicon Oxide Wafer
| British Library Online Contents | 2005
Spatial Distribution of Microdefects Around Dislocations in Si-Doped GaAs
| British Library Online Contents | 1995
Microdefects induced by cavitation for gettering in silicon wafer
| British Library Online Contents | 2006
The fractal approach for the evaluation of microdefects in silicon
| British Library Online Contents | 1995
The effect of carbon and antimony on grown-in microdefects in Czochralski silicon crystals
| British Library Online Contents | 2006