Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Defect levels in n-silicon after high energy and high dose implantation of proton
Defect levels in n-silicon after high energy and high dose implantation of proton
Defect levels in n-silicon after high energy and high dose implantation of proton
Barbot, J. F. (Autor:in) / Blanchard, C. (Autor:in) / Ntsoenzok, E. (Autor:in) / Vernois, J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 36 ; 81-84
01.01.1996
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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