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Microstructure studies of PdGe/Ge ohmic contacts to n-type GaAs formed by rapid thermal annealing
Microstructure studies of PdGe/Ge ohmic contacts to n-type GaAs formed by rapid thermal annealing
Microstructure studies of PdGe/Ge ohmic contacts to n-type GaAs formed by rapid thermal annealing
Chen, W. D. (Autor:in) / Xie, X. L. (Autor:in) / Cui, Y. D. (Autor:in) / Chen, C. H. (Autor:in) / Hsu, C. C. (Autor:in)
APPLIED SURFACE SCIENCE ; 99 ; 530-533
01.01.1996
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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Microstructure studies of PdGe/Ge ohmic contacts to n-type GaAs formed by rapid thermal annealing
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