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Microstructure, electrical properties, and thermal stability of Al ohmic contacts to n-GaN
Microstructure, electrical properties, and thermal stability of Al ohmic contacts to n-GaN
Microstructure, electrical properties, and thermal stability of Al ohmic contacts to n-GaN
Smith, L. L. (Autor:in) / Davis, R. F. (Autor:in) / Kim, M. J. (Autor:in) / Carpenter, R. W. (Autor:in) / Huang, Y. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 11 ; 2257-2262
01.01.1996
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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