Simulation of recombination contrast of extended defects in the modulated EBIC

Sirotkin, V. V. / Yakimov, E. B. / Zaitsev, S. I. | British Library Online Contents | 1996

SCH laser recombination rate from EBIC profiles

Romero, M. J. / Araujo, D. / Garcia, R. | British Library Online Contents | 1996

Conventional EBIC versus MOS/EBIC study of electrically active defects in Si and SOI

Bondarenko, I. / Kirk, H. / Kononchuk, O. et al. | British Library Online Contents | 1996

EBIC study on the electrical activity of stacking faults in silicon

Sekiguchi, T. / Shen, B. / Watanabe, T. et al. | British Library Online Contents | 1996

EBIC studies of grain boundaries

Holt, D. B. / Raza, B. / Wojcik, A. | British Library Online Contents | 1996