Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Hirai, M. (Autor:in) / Marumoto, Y. (Autor:in) / Kusaka, M. (Autor:in) / Iwami, M. (Autor:in) / Ozawa, T. (Autor:in) / Nagamura, T. (Autor:in) / Nakata, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 113/114 ; 360-363
01.01.1997
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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