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Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Hirai, M. (author) / Marumoto, Y. (author) / Kusaka, M. (author) / Iwami, M. (author) / Ozawa, T. (author) / Nagamura, T. (author) / Nakata, T. (author)
APPLIED SURFACE SCIENCE ; 113/114 ; 360-363
1997-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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