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Schottky barrier inhomogeneity at Au/Si(111) interfaces investigated using ultrahigh-vacuum ballistic electron emission microscopy
Schottky barrier inhomogeneity at Au/Si(111) interfaces investigated using ultrahigh-vacuum ballistic electron emission microscopy
Schottky barrier inhomogeneity at Au/Si(111) interfaces investigated using ultrahigh-vacuum ballistic electron emission microscopy
Sumiya, T. (Autor:in) / Miura, T. (Autor:in) / Fujinuma, H. (Autor:in) / Tanaka, S.-I. (Autor:in)
APPLIED SURFACE SCIENCE ; 117/118 ; 329-333
01.01.1997
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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