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Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness
Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness
Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness
Gunter, P. L. J. (Autor:in) / Gijzeman, O. L. J. (Autor:in) / Niemantsverdriet, J. W. (Autor:in)
APPLIED SURFACE SCIENCE ; 115 ; 342-346
01.01.1997
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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