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Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness
Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness
Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness
Gunter, P. L. J. (author) / Gijzeman, O. L. J. (author) / Niemantsverdriet, J. W. (author)
APPLIED SURFACE SCIENCE ; 115 ; 342-346
1997-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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