Depth profiling of defects in nitrogen implanted silicon using a slow positron beam

Taylor, J.W. / Saleh, A.S. / Rice-Evans, P.C. et al. | British Library Online Contents | 1999

Characteristics of positron trapping at defects in neutron-irradiated silicon grown in argon atmosphere

Meng, X. | British Library Online Contents | 1994

Positron Depth Profiling

Coleman, P. G. | British Library Online Contents | 2001

Positron Depth-Profiling of Polymer Interfaces

Gidley, D. W. / DeMaggio, G. B. / Frieze, W. E. et al. | British Library Online Contents | 1997

Slow Positron Beam Facility in Orleans

Desgardin, P. / Liszkay, L. / Barthe, M.-F. et al. | British Library Online Contents | 2001