Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
Cherns, D. (Autor:in) / Young, W. T. (Autor:in) / Ponce, F. A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 50 ; 76-81
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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