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Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
Characterisation of dislocations, nanopipes and inversion domains in GaN by transmission electron microscopy
Cherns, D. (author) / Young, W. T. (author) / Ponce, F. A. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 50 ; 76-81
1997-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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