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Ion dechanneling studies of defects in an ion-beam-synthesized epilayer sandwich system: Si(111)/CoSi~2/Si
Ion dechanneling studies of defects in an ion-beam-synthesized epilayer sandwich system: Si(111)/CoSi~2/Si
Ion dechanneling studies of defects in an ion-beam-synthesized epilayer sandwich system: Si(111)/CoSi~2/Si
Satyam, P. V. (Autor:in) / Sekar, K. (Autor:in) / Kuri, G. (Autor:in) / Sundaravel, B. (Autor:in) / Mahapatra, D. P. (Autor:in) / Dev, B. N. (Autor:in)
APPLIED SURFACE SCIENCE ; 125 ; 173-177
01.01.1998
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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