A TEM and SEM-cathodoluminescence study of oval defects in graded InGaAs/GaAs buffer layers

Lazzarini, L. / Salviati, G. / Franchi, S. et al. | British Library Online Contents | 2001

Growth model of oval defect structures in MBE GaAs layers

Kadhim, N. J. / Mukherjee, D. | British Library Online Contents | 1999

X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers

Macquistan, D. A. / Bassignana, I. C. / SpringThorpe, A. J. et al. | British Library Online Contents | 1993

Defects in Thick Epitaxial Gaas Layers

Samic, H. / Bourgoin, J. C. | British Library Online Contents | 1997

Investigation of oval defects in (In)Ga(Al)As/GaAs heterostructures by spatially resolved photoluminescence and micro-cathodoluminescence

Szerling, A. / Kosiel, K. / Wojcik-Jedlinska, A. et al. | British Library Online Contents | 2006