Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterization of Single Crystal Epitaxial Aluminum Nitride Thin Films on Sapphire, Silicon Carbide and Silicon Substrates by X-Ray Double Crystal Diffractometry and Transmission Electron Microscopy
Characterization of Single Crystal Epitaxial Aluminum Nitride Thin Films on Sapphire, Silicon Carbide and Silicon Substrates by X-Ray Double Crystal Diffractometry and Transmission Electron Microscopy
Characterization of Single Crystal Epitaxial Aluminum Nitride Thin Films on Sapphire, Silicon Carbide and Silicon Substrates by X-Ray Double Crystal Diffractometry and Transmission Electron Microscopy
Chaudhuri, J. (Autor:in) / Thokala, R. (Autor:in) / Edgar, J. H. (Autor:in) / Sywe, B. S. (Autor:in)
ADVANCES IN X RAY ANALYSIS ; 645-652
01.01.1997
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
539.7222
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