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Valence band edge of ultra-thin silicon oxide near the interface
Valence band edge of ultra-thin silicon oxide near the interface
Valence band edge of ultra-thin silicon oxide near the interface
Nohira, H. (Autor:in) / Omura, A. (Autor:in) / Katayama, M. (Autor:in) / Hattori, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 123/124 ; 546-549
01.01.1998
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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