Valence band edge of ultra-thin silicon oxide near the interface

Nohira, H. / Omura, A. / Katayama, M. et al. | British Library Online Contents | 1998

Structural evolution and valence electron-state change during ultra thin silicon-oxide growth

Shimizu, A. / Abe, S. / Nakayama, H. et al. | British Library Online Contents | 2000

Weak fluence dependence of charge generation in ultra-thin oxides on silicon

Farmer, K. R. / Debauche, C. P. / Giordano, A. R. et al. | British Library Online Contents | 1996

Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures

Varzgar, J. B. / Kanoun, M. / Uppal, S. et al. | British Library Online Contents | 2006

Contactless characterization of surface and interface band-bending in Silicon-On-Insulator (SOI) structures

Okumura, T. / En, A. / Eguchi, K. et al. | British Library Online Contents | 2002