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Structural evolution and valence electron-state change during ultra thin silicon-oxide growth
Structural evolution and valence electron-state change during ultra thin silicon-oxide growth
Structural evolution and valence electron-state change during ultra thin silicon-oxide growth
Shimizu, A. (Autor:in) / Abe, S. (Autor:in) / Nakayama, H. (Autor:in) / Nishino, T. (Autor:in) / Iida, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 159-160 ; 89-97
01.01.2000
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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