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Evolution of film stress with accumulation of misfit dislocations at semiconductor interfaces
Evolution of film stress with accumulation of misfit dislocations at semiconductor interfaces
Evolution of film stress with accumulation of misfit dislocations at semiconductor interfaces
Trukhanov, E. M. (Autor:in) / Fritzler, K. B. (Autor:in) / Lyubas, G. A. (Autor:in) / Kolesnikov, A. V. (Autor:in)
APPLIED SURFACE SCIENCE ; 123/124 ; 664-668
01.01.1998
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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