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Film quality effects associated with formation of misfit dislocations at semiconductor interfaces
Film quality effects associated with formation of misfit dislocations at semiconductor interfaces
Film quality effects associated with formation of misfit dislocations at semiconductor interfaces
Trukhanov, E. M. (Autor:in) / Kolesnikov, A. V. (Autor:in)
APPLIED SURFACE SCIENCE ; 123/124 ; 669-673
01.01.1998
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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