Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
Lassen, N. C. K. (Autor:in)
MATERIALS SCIENCE FORUM ; 273/275 ; 201-208
01.01.1998
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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