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Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy
Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy
Shear Induced Low- and High-Angle Boundary Characterization Using Kikuchi Bands in Transmission Electron Microscopy
Cabibbo, M. (Autor:in) / Estrin, Y. / Maier, H.J.
01.01.2008
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Transmission Kikuchi diffraction in a scanning electron microscope: A review
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