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A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
A New Procedure for Automatic High Precision Measurements of the Position and Width of Bands in Backscatter Kikuchi Patterns
Lassen, N. C. K. (author)
MATERIALS SCIENCE FORUM ; 273/275 ; 201-208
1998-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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