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Low energy IBAD: correlation between process parameters and film properties for ion beam assisted evaporation and sputter deposition
Low energy IBAD: correlation between process parameters and film properties for ion beam assisted evaporation and sputter deposition
Low energy IBAD: correlation between process parameters and film properties for ion beam assisted evaporation and sputter deposition
Oechsner, H. (Autor:in) / Schafft, M. (Autor:in) / Schumacher, A. (Autor:in) / Wolff, D. (Autor:in)
MATERIALWISSENSCHAFT UND WERKSTOFFTECHNIK ; 29 ; 466-475
01.01.1998
10 pages
Aufsatz (Zeitschrift)
Deutsch
DDC:
620.11
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