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A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy
A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy
A transmission electron microscopy investigation of SiC films grown on Si(111) substrates by solid-source molecular beam epitaxy
Kaiser, U. (Autor:in) / Newcomb, S. B. (Autor:in) / Stobbs, W. M. (Autor:in) / Adamik, M. (Autor:in) / Fissel, A. (Autor:in) / Richter, W. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 13 ; 3571-3579
01.01.1998
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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