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Measuring the critical thickness of thin metalorganic precursor films
Measuring the critical thickness of thin metalorganic precursor films
Measuring the critical thickness of thin metalorganic precursor films
Roeder, R. K. (Autor:in) / Slamovich, E. B. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 14 ; 2364-2368
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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