Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Sushko, P.V. (Autor:in) / Foster, A.S. (Autor:in) / Kantorovich, L.N. (Autor:in) / Shluger, A.L. (Autor:in)
APPLIED SURFACE SCIENCE ; 144 ; 608-612
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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