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    Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

    New search for: Sushko, P.V.
    New search for: Foster, A.S.
    New search for: Kantorovich, L.N.
    New search for: Shluger, A.L.

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    Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

    New search for: Sushko, P.V.
    New search for: Foster, A.S.
    New search for: Kantorovich, L.N.
    New search for: Shluger, A.L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

    New search for: Sushko, P.V.
    New search for: Foster, A.S.
    New search for: Kantorovich, L.N.
    New search for: Shluger, A.L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

    Contributors:

    Sushko, P.V. (author) / Foster, A.S. (author) / Kantorovich, L.N. (author) / Shluger, A.L. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 144 ; 608-612

    Publication date:

    1999-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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