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Fabrication and analysis of the nanometer-sized structure of silicon by ultrahigh vacuum field emission transmission electron microscope
Fabrication and analysis of the nanometer-sized structure of silicon by ultrahigh vacuum field emission transmission electron microscope
Fabrication and analysis of the nanometer-sized structure of silicon by ultrahigh vacuum field emission transmission electron microscope
Takeguchi, M. (Autor:in) / Tanaka, M. (Autor:in) / Furuya, K. (Autor:in)
APPLIED SURFACE SCIENCE ; 146 ; 257-261
01.01.1999
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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