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The use of high-energy synchrotron diffraction for residual stress analyses
The use of high-energy synchrotron diffraction for residual stress analyses
The use of high-energy synchrotron diffraction for residual stress analyses
Reimers, W. (Autor:in) / Pyzalla, A. (Autor:in) / Broda, M. (Autor:in) / Brusch, G. (Autor:in) / Dantz, D. (Autor:in) / Schmackers, T. (Autor:in) / Liss, K.-D. (Autor:in) / Tschentscher, T. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 18 ; 581-584
01.01.1999
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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