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The use of high-energy synchrotron diffraction for residual stress analyses

Reimers, W. / Pyzalla, A. / Broda, M. / Brusch, G. / Dantz, D. / Schmackers, T. / Liss, K.-D. / Tschentscher, T.

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The use of high-energy synchrotron diffraction for residual stress analyses

Reimers, W. / Pyzalla, A. / Broda, M. / Brusch, G. / Dantz, D. / Schmackers, T. / Liss, K.-D. / Tschentscher, T.

The use of high-energy synchrotron diffraction for residual stress analyses

Reimers, W. / Pyzalla, A. / Broda, M. / Brusch, G. / Dantz, D. / Schmackers, T. / Liss, K.-D. / Tschentscher, T.

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Check availability in my library

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Document information

Title:

The use of high-energy synchrotron diffraction for residual stress analyses

Contributors:

Reimers, W. (author) / Pyzalla, A. (author) / Broda, M. (author) / Brusch, G. (author) / Dantz, D. (author) / Schmackers, T. (author) / Liss, K.-D. (author) / Tschentscher, T. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 18 ; 581-584

Publication date:

1999-01-01

Size:

4 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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