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Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space
Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space
Residual Stress Analysis by Energy-Dispersive Synchrotron Diffraction: Concepts for High Resolution Depth Profiling in Real Space
Fuss, T. (Autor:in) / Meixner, M. (Autor:in) / Klaus, M. (Autor:in) / Genzel, C. (Autor:in) / Kurz, S.J.B. / Mittemeijer, E.J. / Scholtes, B.
01.01.2014
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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