Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Scanning tunneling microscopy of hydrogenated amorphous silicon: high-resolution topography and local apparent barrier heights
Scanning tunneling microscopy of hydrogenated amorphous silicon: high-resolution topography and local apparent barrier heights
Scanning tunneling microscopy of hydrogenated amorphous silicon: high-resolution topography and local apparent barrier heights
Herion, J. (Autor:in)
APPLIED SURFACE SCIENCE ; 151 ; 73-85
01.01.1999
13 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Resolution in Scanning Tunneling Microscopy
| Springer Verlag | 1988
Single-electron tunneling in double-barrier junctions by scanning tunneling microscopy
| British Library Online Contents | 1993
| British Library Online Contents | 1994
| Springer Verlag | 1986