Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Microscopic characterization of defects using scanning tunneling microscopy
Microscopic characterization of defects using scanning tunneling microscopy
Microscopic characterization of defects using scanning tunneling microscopy
Stievenard, D. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 120 - 127
01.01.2000
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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