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A platform for research: civil engineering, architecture and urbanism
Microscopic characterization of defects using scanning tunneling microscopy
Microscopic characterization of defects using scanning tunneling microscopy
Microscopic characterization of defects using scanning tunneling microscopy
Stievenard, D. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 120 - 127
2000-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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