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Fracture origins in LiNbO~3 wafers due to postprocessing micro-repolarization
Fracture origins in LiNbO~3 wafers due to postprocessing micro-repolarization
Fracture origins in LiNbO~3 wafers due to postprocessing micro-repolarization
Nagata, H. (Autor:in) / Ichikawa, J. (Autor:in) / Sakima, M. (Autor:in) / Shima, K. (Autor:in) / Haga, E. M. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 17-20
01.01.2000
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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