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Fracture origins in LiNbO~3 wafers due to postprocessing micro-repolarization
Fracture origins in LiNbO~3 wafers due to postprocessing micro-repolarization
Fracture origins in LiNbO~3 wafers due to postprocessing micro-repolarization
Nagata, H. (author) / Ichikawa, J. (author) / Sakima, M. (author) / Shima, K. (author) / Haga, E. M. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 15 ; 17-20
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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