Comparison of high temperature annealed Czochralski silicon wafers and epitaxial wafers

Graef, D. / Lambert, U. / Brohl, M. et al. | British Library Online Contents | 1996

Interface Defects of Bonded Silicon Wafers

Reiche, M. / Tong, Q.-Y. / Goesele, U. et al. | British Library Online Contents | 1995

Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers

Kirscht, F. G. / Furukawa, Y. / Seifert, W. et al. | British Library Online Contents | 1996

Investigation of oxygen precipitation related crystal defects in processed silicon wafers by infrared light scattering tomography

Kissinger, G. / Vanhellemont, J. / Simoen, E. et al. | British Library Online Contents | 1996

Study of PbTe Epitaxial Layers Grown Directly Over Silicon Wafers

Guimaraes, S. / da Silva, S. d. C. F. F. | British Library Online Contents | 2002