Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy
Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy
Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy
Arai, T. (Autor:in) / Tomitori, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 157 ; 207-211
01.01.2000
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Noncontact Atomic Force Microscopy
| TIBKAT | 2002
Effect of temperature on noncontact atomic force microscopy images
| British Library Online Contents | 2002
True atomic resolution imaging with noncontact atomic force microscopy
| British Library Online Contents | 1997
Surface structure investigations using noncontact atomic force microscopy
| British Library Online Contents | 2006
DNA molecules sticking on a vicinal Si(111) surface observed by noncontact atomic force microscopy
| British Library Online Contents | 2002