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    Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy

    New search for: Arai, T.
    New search for: Tomitori, M.

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    Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy

    New search for: Arai, T.
    New search for: Tomitori, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy

    New search for: Arai, T.
    New search for: Tomitori, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Bias dependence of Si(111)7x7 images observed by noncontact atomic force microscopy

    Contributors:

    Arai, T. (author) / Tomitori, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 157 ; 207-211

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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