Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy films
Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy films
Structural characterization of rapid thermally oxidized silicon-germanium-carbon alloy films
Choi, W. K. (Autor:in) / Bera, L. K. (Autor:in) / Chen, J. H. (Autor:in) / Feng, W. (Autor:in) / Pey, K. L. (Autor:in) / Yoong, H. (Autor:in) / Mi, J. (Autor:in) / Zhang, F. (Autor:in) / Yang, C. Y. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 75 ; 184 - 186
01.01.2000
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Physisorption of krypton on thermally oxidized silicon wafers
British Library Online Contents | 1993
|Surface Characterization of Thermally Oxidized Titanium Alloys
British Library Online Contents | 2010
|High Cycle Fatigue Behavior of Thermally Oxidized Ti6Al4V Alloy
British Library Online Contents | 2007
|AFM surface imaging of thermally oxidized hydrogenated crystalline silicon
British Library Online Contents | 2002
|Low temperature, high growth rate epitaxial silicon and silicon germanium alloy films
British Library Online Contents | 2004
|